When testing a system modelled as a finite state machine it is desirable to minimize the effort required. It has been demonstrated that it is possible to utilize test sequence overlap in order to reduce the test effort and this overlap has been represented by using invertible transitions. In this paper invertibility will be extended to sequences in order to reduce the test effort further and encapsulate a more general type of test sequence overlap. It will also be shown that certain properties of invertible sequences can be used in the generation of state identification sequences.