3D chemical characterization of frozen hydrated hydrogels using ToF-SIMS with argon cluster sputter depth profiling

Title: 3D chemical characterization of frozen hydrated hydrogels using ToF-SIMS with argon cluster sputter depth profiling;
ToF-SIMS of hydrogels

Taylor, Michael

Data storage of 3 ToF-SIMS depth profiles of frozen-hydrated hydrogels as required by the EPSRC data deposit requirement

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25% L-AME POSS-PCU N6 repeat1_7.TXT	7.15Kb	text/plain	View/Open
3 Dips pHEMA DP P3_9.TXT	7.083Kb	text/plain	View/Open
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