| dc.contributor |
Zelzer, Mischa |
|
| dc.contributor |
Buttery, Lee |
|
| dc.contributor |
Scurr, David |
|
| dc.contributor |
Alexander, Morgan |
|
| dc.creator |
Taylor, Michael |
|
| dc.date |
2016-09-20T11:58:35Z |
|
| dc.date |
2016-09-20T11:58:35Z |
|
| dc.date |
2016-09-20 |
|
| dc.date |
15/08/15 |
|
| dc.identifier |
https://rdmc.nottingham.ac.uk/handle/internal/61 |
|
| dc.identifier |
http://doi.org/10.17639/nott.58 |
|
| dc.description |
Data storage of 3 ToF-SIMS depth profiles of frozen-hydrated hydrogels as required by the EPSRC data deposit requirement |
|
| dc.language |
en |
|
| dc.publisher |
University of Nottingham |
|
| dc.relation |
10.1116/1.4928209 |
|
| dc.subject |
Time-of-flight mass spectrometry |
|
| dc.subject |
Ion mobility spectroscopy |
|
| dc.subject |
Colloids |
|
| dc.subject |
Pharmaceutical chemistry -- Analysis |
|
| dc.subject |
Hydrogel, ToF-SIMS, Frozen |
|
| dc.subject |
Physical sciences::Materials science |
|
| dc.subject |
Q Science::QD Chemistry::QD 71 Analytical chemistry |
|
| dc.title |
3D chemical characterization of frozen hydrated hydrogels using ToF-SIMS with argon cluster sputter depth profiling |
|
| dc.title |
ToF-SIMS of hydrogels |
|
| dc.type |
dataset |
|