Sangam: A Confluence of Knowledge Streams

Effect of Rear Surface Electro-Static Fields on Hot, Refluxing and Escaping Electron Populations via PIC Simulations

Show simple item record

dc.creator Rusby, Dean
dc.creator Neely, David
dc.creator Armstrong, Chris
dc.date 2018-12-11T18:50:01Z
dc.date 2018-12-11T18:50:01Z
dc.date 2018
dc.date.accessioned 2022-05-26T11:02:57Z
dc.date.available 2022-05-26T11:02:57Z
dc.identifier http://purl.org/net/edata/handle/edata/746
dc.identifier http://dx.doi.org/10.5286/edata/721
dc.identifier.uri http://localhost:8080/xmlui/handle/CUHPOERS/204144
dc.description The paper is a study of the refluxing and escaping electrons from a laser-solid interaction using the Particle in Cell code EPOCH. This dataset only includes the simulation input decks that is used in the paper as the results are many terabytes of data.
dc.language en
dc.relation https://doi.org/10.1017/hpl.2019.34
dc.rights Creative Commons Attribution 4.0 International
dc.rights https://creativecommons.org/licenses/by/4.0/
dc.subject Laser Solid Interaction
dc.subject Refluxing Electrons
dc.subject Escaping Electrons
dc.subject Particle in Cell
dc.title Effect of Rear Surface Electro-Static Fields on Hot, Refluxing and Escaping Electron Populations via PIC Simulations
dc.type Dataset


Files in this item

Files Size Format View
intscan.zip 8.607Kb application/zip View/Open

This item appears in the following Collection(s)

Show simple item record

Search DSpace


Advanced Search

Browse