Sangam: A Confluence of Knowledge Streams

1/f noise in MOSFETs with ultrathin gate dielectrics

Files in this item

Files Size Format View
26680871-MIT.pdf 15.75Mb application/pdf View/Open

This item appears in the following Collection(s)

  • DSpace@MIT [2699]
    DSpace@MIT is a digital repository for MIT's research, including peer-reviewed articles, technical reports, working papers, theses, and more.

Search DSpace


Advanced Search

Browse