| dc.contributor |
Charles G. Sodini. |
|
| dc.contributor |
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science |
|
| dc.creator |
Gross, Blaine Jeffrey |
|
| dc.date |
2005-08-15T16:49:31Z |
|
| dc.date |
2005-08-15T16:49:31Z |
|
| dc.date |
1992 |
|
| dc.date |
1992 |
|
| dc.date.accessioned |
2022-05-04T06:14:37Z |
|
| dc.date.available |
2022-05-04T06:14:37Z |
|
| dc.identifier |
http://hdl.handle.net/1721.1/13192 |
|
| dc.identifier |
26680871 |
|
| dc.identifier.uri |
http://localhost:8080/xmlui/handle/CUHPOERS/2146 |
|
| dc.description |
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1992. |
|
| dc.description |
Includes bibliographical references (p. 176-184). |
|
| dc.description |
by Blaine Jeffrey Gross. |
|
| dc.description |
Ph.D. |
|
| dc.format |
230 p. |
|
| dc.format |
15757829 bytes |
|
| dc.format |
15757585 bytes |
|
| dc.format |
application/pdf |
|
| dc.format |
application/pdf |
|
| dc.format |
application/pdf |
|
| dc.language |
eng |
|
| dc.publisher |
Massachusetts Institute of Technology |
|
| dc.rights |
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. |
|
| dc.rights |
http://dspace.mit.edu/handle/1721.1/7582 |
|
| dc.subject |
Electrical Engineering and Computer Science |
|
| dc.title |
1/f noise in MOSFETs with ultrathin gate dielectrics |
|
| dc.type |
Thesis |
|