Sangam: A Confluence of Knowledge Streams

Radiation Tolerant Electronics, Volume II

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dc.contributor Leroux, Paul
dc.date 2023-02-02T16:37:08Z
dc.date 2023-02-02T16:37:08Z
dc.date 2023
dc.date.accessioned 2023-02-17T21:16:12Z
dc.date.available 2023-02-17T21:16:12Z
dc.identifier ONIX_20230202_9783036564456_86
dc.identifier https://directory.doabooks.org/handle/20.500.12854/96685
dc.identifier https://mdpi.com/books/pdfview/book/6630
dc.identifier https://mdpi.com/books/pdfview/book/6630
dc.identifier.uri http://localhost:8080/xmlui/handle/CUHPOERS/245805
dc.description Research on radiation tolerant electronics has increased rapidly over the last few years, resulting in many interesting approaches to model radiation effects and design radiation hardened integrated circuits and embedded systems. This research is strongly driven by the growing need for radiation hardened electronics for space applications, high-energy physics experiments such as those on the large hadron collider at CERN, and many terrestrial nuclear applications, including nuclear energy and safety management. With the progressive scaling of integrated circuit technologies and the growing complexity of electronic systems, their ionizing radiation susceptibility has raised many exciting challenges, which are expected to drive research in the coming decade.After the success of the first Special Issue on Radiation Tolerant Electronics, the current Special Issue features thirteen articles highlighting recent breakthroughs in radiation tolerant integrated circuit design, fault tolerance in FPGAs, radiation effects in semiconductor materials and advanced IC technologies and modelling of radiation effects.
dc.format image/jpeg
dc.language eng
dc.publisher MDPI - Multidisciplinary Digital Publishing Institute
dc.rights open access
dc.subject triple modular redundancy
dc.subject 65 nm CMOS technology
dc.subject single event effects
dc.subject radiation hardening by design
dc.subject digital integrated circuits
dc.subject fault injection
dc.subject simulation
dc.subject VHDL
dc.subject open source tools
dc.subject triple modular redundancy TMR
dc.subject time redundancy (TR)
dc.subject TMR/Simplex
dc.subject reliability improvement factor (RIF)
dc.subject half-duty limited DC-DC converter
dc.subject total ionizing dose
dc.subject system-level testing
dc.subject point-of-load converter
dc.subject radiation hardness assurance
dc.subject system qualification
dc.subject All-Digital
dc.subject PLL
dc.subject CDR
dc.subject Single-Event Effects
dc.subject radiation hardening
dc.subject system-level tests
dc.subject D Flip-Flop
dc.subject heavy ion
dc.subject radiation hardened
dc.subject Single Event Upset
dc.subject D-type flip-flop
dc.subject single event transient
dc.subject single event upset
dc.subject quadrature
dc.subject super-harmonic
dc.subject LC-tank
dc.subject Q-phase
dc.subject VCO
dc.subject QVCO
dc.subject radiation
dc.subject TID
dc.subject SEE
dc.subject X-ray
dc.subject high energy physics
dc.subject radiation hardened by design
dc.subject 22-nm FD SOI
dc.subject 28-nm FD SOI
dc.subject Co-60
dc.subject flip-flop (FF)
dc.subject radiation effects
dc.subject ring oscillator (RO)
dc.subject static random-access memory (SRAM)
dc.subject total ionizing dose (TID)
dc.subject radiation effect
dc.subject radiation test method
dc.subject sensitive area
dc.subject parasitic bipolar amplification
dc.subject processor
dc.subject laser test
dc.subject generalized linear model
dc.subject ensemble method
dc.subject confidence interval
dc.subject double-node upset (DNU)
dc.subject radiation-hardened latch
dc.subject radiation hardening by design (RHBD)
dc.subject single event upset polarity
dc.subject single-node upset (SNU)
dc.subject soft error
dc.subject n/a
dc.subject bic Book Industry Communication::T Technology, engineering, agriculture::TB Technology: general issues
dc.subject bic Book Industry Communication::T Technology, engineering, agriculture::TB Technology: general issues::TBX History of engineering & technology
dc.subject bic Book Industry Communication::K Economics, finance, business & management::KN Industry & industrial studies::KNB Energy industries & utilities
dc.title Radiation Tolerant Electronics, Volume II
dc.resourceType book
dc.alternateIdentifier 9783036564456
dc.alternateIdentifier 9783036564449
dc.alternateIdentifier 10.3390/books978-3-0365-6444-9
dc.licenseCondition Attribution 4.0 International
dc.identifierdoi 10.3390/books978-3-0365-6444-9
dc.relationisPublishedBy 46cabcaa-dd94-4bfe-87b4-55023c1b36d0
dc.relationisbn 9783036564456
dc.relationisbn 9783036564449
dc.pages 182
dc.placepublication Basel


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