Thermal measurement of RF and microwave devices using a novel thermal probe.

dc.creator	Hopper, Richard
dc.creator	Glover, James
dc.creator	Evans, Gwynne A.
dc.creator	Oxley, C. H.
dc.date	2012-10-16T15:53:26Z
dc.date	2012-10-16T15:53:26Z
dc.date	2011
dc.date.accessioned	2023-02-22T17:04:28Z
dc.date.available	2023-02-22T17:04:28Z
dc.identifier	Hopper, R.H. et al. (2011) Thermal measurement of RF and microwave devices using a novel thermal probe. 2nd Annual Passive RF and Microwave Components Seminar, pp. 69-71
dc.identifier	9781849193221
dc.identifier	http://hdl.handle.net/2086/7577
dc.identifier	https://doi.org/10.1049/ic.2011.0207
dc.identifier.uri	http://localhost:8080/xmlui/handle/CUHPOERS/254418
dc.language	en
dc.publisher	IEEE
dc.title	Thermal measurement of RF and microwave devices using a novel thermal probe.
dc.type	Conference

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