| dc.contributor |
Robert M. Fano. |
|
| dc.contributor |
Massachusetts Institute of Technology. Department of Electrical Engineering |
|
| dc.contributor |
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science |
|
| dc.creator |
Yudkin, Howard Louis |
|
| dc.date |
2008-01-10T16:08:42Z |
|
| dc.date |
2008-01-10T16:08:42Z |
|
| dc.date |
1965 |
|
| dc.date.accessioned |
2023-03-01T07:22:40Z |
|
| dc.date.available |
2023-03-01T07:22:40Z |
|
| dc.identifier |
http://hdl.handle.net/1721.1/39965 |
|
| dc.identifier |
25645063 |
|
| dc.identifier.uri |
http://localhost:8080/xmlui/handle/CUHPOERS/275812 |
|
| dc.description |
Massachusetts Institute of Technology. Dept. of Electrical Engineering. Thesis. 1965. Ph.D. |
|
| dc.description |
Ph.D. |
|
| dc.format |
126 leaves |
|
| dc.format |
application/pdf |
|
| dc.language |
eng |
|
| dc.publisher |
Massachusetts Institute of Technology |
|
| dc.rights |
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. |
|
| dc.rights |
http://dspace.mit.edu/handle/1721.1/7582 |
|
| dc.subject |
Electrical Engineering |
|
| dc.title |
Channel state testing in information decoding. |
|
| dc.type |
Thesis |
|