Sangam: A Confluence of Knowledge Streams

Exchange bias invastigations in ion-beam sputtered antiferromagnetic/ ferromagnetic bilayer thin films for spintronics

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dc.contributor Chaudhary, Sujeet
dc.contributor Kashyap, Subhash C.
dc.creator Fulara, Himanshu
dc.date 2015-07-08T09:15:21Z
dc.date 2019-02-10T13:32:37Z
dc.date 2019-02-11T06:02:53Z
dc.date 2015-07-08T09:15:21Z
dc.date 2019-02-10T13:32:37Z
dc.date 2019-02-11T06:02:53Z
dc.date 2014
dc.date.accessioned 2023-04-19T05:01:27Z
dc.date.available 2023-04-19T05:01:27Z
dc.identifier TH 532.62 FUL-E
dc.identifier http://localhost:8080/iit/handle/2074/6518
dc.identifier.uri http://localhost:8080/xmlui/handle/CUHPOERS/287033
dc.format application/pdf
dc.language en
dc.relation TH-4553;
dc.title Exchange bias invastigations in ion-beam sputtered antiferromagnetic/ ferromagnetic bilayer thin films for spintronics
dc.type Thesis


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